Designing low-power flip-flops with better reliability becomes crucial as the need for energy-efficient and high-performance integrated circuits continues to climb. A Low Power Redundant-Transition-Free True Single-Phase Clock (TSPC) Dual-Edge-Triggering Flip-Flop (DETFF) leveraging a Single-Transistor-Clocked Buffer (STCB) is developed and presented in this work as a new way to deal with these problems. With the goal of improving performance and reducing Low power consumption, the proposed design integrates the TSPC & DETFF optimums. architectures by reducing the number of redundant transitions during clocking and guaranteeing strong dual-edge triggering. An unique Single-Transistor-Clocked Buffer is also used to optimize the clock distribution network, which further contributes to power efficiency. Power consumption, speed, and dependability are some of the performance indicators measured by the flip-flop. These are assessed by comprehensive simulations conducted using technologies usually used in the industry. Testing the suggested architecture against current flip-flop designs shows that it is more efficient and reliable. Not to mention completely changing the game when it comes to low-power digital circuits design, the proposed Low Power Redundant-Transition-Free TSPC DETFF with Single-Transistor-Clocked Buffer has also made a substantial impact as an exciting new direction for future integrated circuits, which will require increased reliability and energy efficiency. Among the most potent building elements of processing in the GPU/AI era is the flip-flop (FF). An STC-based, dual-edge-triggered (DET) FF based on buffers is introduced to solve this problem. In the realm of data testing, STC support is great because it only needs one timed semiconductor and gets rid of all the internal and clock excess changes that other DET methods have. Approval for 22nm FD-SOI CMOS post-format recreations at 10% swapping movement.